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Onto Innovation Inc. specializes in the development and provision of advanced process control tools that encompass macro defect inspection, 2D/3D optical metrology, lithography systems, and process control software solutions across global markets. The company's comprehensive portfolio includes standalone systems for macro-defect inspection, packaging lithography, probe card testing and analysis, as well as measurements of transparent and opaque thin films. These tools are pivotal in ensuring the quality and efficiency of manufacturing processes in semiconductor and advanced packaging industries.
In addition to its hardware offerings, Onto Innovation provides a robust process control software suite designed for standalone tools, tool groups, and enterprise-wide deployments. These software solutions empower manufacturers to optimize process performance, enhance yield management, and streamline operational efficiencies across their facilities.
Onto Innovation serves a diverse clientele spanning semiconductor manufacturers, silicon wafer producers, LED and laser device manufacturers, CMOS image sensor developers, power device manufacturers, RF filter producers, and other industrial and scientific sectors. The company's solutions play a crucial role in enabling cutting-edge technologies and innovations across these industries.
Founded in 1940 and headquartered in Wilmington, Massachusetts, Onto Innovation Inc. was formerly known as Rudolph Technologies, Inc. The company's rich legacy and commitment to technological advancement underscore its leadership in providing critical process control tools and software solutions to enable precision manufacturing worldwide.
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