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Aehr Test Systems specializes in providing advanced test systems for burning-in semiconductor devices across global markets. The company offers a range of products tailored for various testing needs, including the ABTS system used in production and qualification testing of packaged parts for lower power and higher power logic devices, as well as common types of memory devices. Their FOX-XP and FOX-NP systems are designed for full wafer contact and singulated die/module test and burn-in, supporting complex devices such as silicon carbide-based power semiconductors, memories, digital signal processors, microprocessors, microcontrollers, systems-on-a-chip, and integrated optical devices.
In addition to these systems, Aehr Test Systems provides the FOX-CP system, a single-wafer compact test and reliability verification solution for logic, memory, and photonic devices. Their FOX product line also includes innovative tools like the FOX WaferPak Aligner and FOX WaferPak Contactor, which feature full wafer probe cards capable of testing wafers up to 300mm. These tools enable IC manufacturers to conduct comprehensive test and burn-in processes efficiently on Aehr's FOX systems.
The company further supports semiconductor testing with the FOX DiePak Carrier, a reusable temporary package facilitating final test and burn-in of bare die and modules, alongside the FOX DiePak Loader. Incorporated in 1977 and headquartered in Fremont, California, Aehr Test Systems continues to lead in semiconductor testing innovation, serving diverse sectors and advancing technology capabilities in global markets.
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